Paper
12 April 2001 Correlation between absorption and scattering imaging in optical materials (Abstract Only)
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Abstract
Absorption and scattering present local defects which can be imaged simultaneously in exactly the same conditions, allowing a precise study of correlation between absorption and scattering spatial variations in thin film materials and surfaces. Absorption A is linearly related to the extinction coefficient whereas scattering S is mainly due to surface profile and refractive index variations. Furthermore spatial frequencies involved in these variations take a great part in scattering. However imaginary and real parts of the complex index are related by KK relations, and correlation A/S depending on the wavelength can be expected. Simulations in fused silica are presented. Studies of correlation give information about nature of defects.
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Mireille Commandre, Alexandre Gatto, Annelise During, and Caroline Fossati "Correlation between absorption and scattering imaging in optical materials (Abstract Only)", Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); https://doi.org/10.1117/12.425022
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KEYWORDS
Scattering

Absorption

Light scattering

Raman scattering

Scatter measurement

Optical imaging

Spatial resolution

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