Paper
7 March 2001 Semiconductor laser longitudinal mode structure study by high-resolution spectroscopy
Ladislav Kuna, Frantisek Uherek
Author Affiliations +
Proceedings Volume 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics; (2001) https://doi.org/10.1117/12.417843
Event: 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2000, Velke Losiny, Czech Republic
Abstract
For the study of the longitudinal mode structure of semiconductor lasers, a diagnostic method is needed in which the spectral resolution is many times better than the distance between the adjacent longitudinal modes. A diagnostic method based on the high-resolution spectroscopy, the lock-in detection technique and a specially designed software package has been developed. The measured spectra of a semiconductor laser show that the method describes the spectrum with sufficient spectral and signal resolutions.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ladislav Kuna and Frantisek Uherek "Semiconductor laser longitudinal mode structure study by high-resolution spectroscopy", Proc. SPIE 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, (7 March 2001); https://doi.org/10.1117/12.417843
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KEYWORDS
Semiconductor lasers

Spectral resolution

Diagnostics

Spectroscopy

Monochromators

Fabry–Perot interferometers

Gallium arsenide

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