15 March 2001 Optimum thickness of cubic photorefractive piezocrystal for diffraction efficiency
Author Affiliations +
Proceedings Volume 4358, Optics of Crystals; (2001) https://doi.org/10.1117/12.418843
Event: Optics of Crystals, 2000, Mozyr, Belarus
Abstract
The analytical dependencies of crystal thickness, for which the diffraction efficiency optimized on the polarization angle reaches the maximum values, on the orientation angle are derived. It is shown that optimum thickness of the crystal is inversely proportional to its specific rotation and plots of dependence of crystal optimum thickness on the orientation angle are set of an equidistant curves with period 180 degree(s) corresponding different local maxima. A distance between these curves is defined by the specific rotation of the crystal (alpha) . The optimum thickness for the first local maximum can not be less than (pi) /(2(alpha) ). The magnitudes of crystal thickness, optimal for the diffraction efficiency of the hologram and gain coincide for some intervals of the orientation angle (theta) between the gating vector and direction [001]. Analytical expression, permitting to determine the azimuths of polarization of a reading light, at which the diffraction efficiency will be optimized simultaneously on the polarization angle and the crystal thickness, is found.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yi Hu, Yi Hu, Klaus H. Ringhofer, Klaus H. Ringhofer, Ekaterina F. Shamonina, Ekaterina F. Shamonina, Alexander A. Firsov, Alexander A. Firsov, Vasiliy V. Shepelevich, Vasiliy V. Shepelevich, } "Optimum thickness of cubic photorefractive piezocrystal for diffraction efficiency", Proc. SPIE 4358, Optics of Crystals, (15 March 2001); doi: 10.1117/12.418843; https://doi.org/10.1117/12.418843
PROCEEDINGS
10 PAGES


SHARE
Back to Top