Paper
31 August 2001 Optimization of resistor array infrared projector temporal response
Author Affiliations +
Abstract
The thermal conduction and electronic drive processes that govern the temporal response of resistor array infrared projectors are reviewed. The characteristics and limitations of the voltage overdrive method that can be implemented for sharpening the temporal response are also discussed. Overdrive is shown to be a viable technique provided sufficient drive power and temperature margins are available outside of the normal dynamic range. It is shown also by analysis of overdrive measurements applied to a Honeywell GE snapshot resistor array that practical real-time overdrive processors can be designed to operate consistently with theoretical predictions.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric M. Olson, Owen M. Williams, and Rhoe A. Thompson "Optimization of resistor array infrared projector temporal response", Proc. SPIE 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, (31 August 2001); https://doi.org/10.1117/12.438097
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Projection systems

Infrared radiation

Resistors

Temperature metrology

Thermography

Black bodies

Calibration

Back to Top