31 August 2001 Optimization of resistor array infrared projector temporal response
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Abstract
The thermal conduction and electronic drive processes that govern the temporal response of resistor array infrared projectors are reviewed. The characteristics and limitations of the voltage overdrive method that can be implemented for sharpening the temporal response are also discussed. Overdrive is shown to be a viable technique provided sufficient drive power and temperature margins are available outside of the normal dynamic range. It is shown also by analysis of overdrive measurements applied to a Honeywell GE snapshot resistor array that practical real-time overdrive processors can be designed to operate consistently with theoretical predictions.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric M. Olson, Eric M. Olson, Owen M. Williams, Owen M. Williams, Rhoe A. Thompson, Rhoe A. Thompson, } "Optimization of resistor array infrared projector temporal response", Proc. SPIE 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, (31 August 2001); doi: 10.1117/12.438097; https://doi.org/10.1117/12.438097
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