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10 October 2001 Nonthermally stabilized operation of a microbolometer for rapid turn-on
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Abstract
Microbolometers respond to variations in impinging infrared energy through changes in the temperature of their thermally isolated detector structure. Thus, variations in the temperature of the substrate give rise to erroneous detector output variations. In order to minimize these effects, microbolometers are thermally stabilized using Peltier- junction coolers or heaters and operated and calibrated at a single temperature set point. This method provides the lowest thermal fluctuation noise at the expense of power consumption, waste heat generation and power-up readiness times often measured in minutes. This paper discusses strategies for providing rapid system readiness through non-thermally stabilized operation over a broad temperature range. A commercially available thermal imaging module which produces analog or digital images within 300 ms of power-up and operates without choppers, shutters or thermal stabilization has been demonstrated.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan P. Knauth and Steven M. Balick "Nonthermally stabilized operation of a microbolometer for rapid turn-on", Proc. SPIE 4369, Infrared Technology and Applications XXVII, (10 October 2001); https://doi.org/10.1117/12.445294
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