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10 September 2001 Characterization/test software for high-density IR focal planes
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Abstract
This paper describes test software developed for both the 480 X 12 X 4 and 256 X 256 InSb focal planes manufactured at Litton EOS, Tempe, AZ. The software controls flux sources, frame grabbers and control electronics to provide a fully automated test environment. As well as providing focal plane screening and characterization, the software is an essential diagnostic tool, whereby critical performance attributes such as R0A, quantum efficiency and noise may be displayed both in histogram form and as spatial color-coded bitmap images. These bitmap images may be scanned using the mouse, so that the performance attributes of each pixel may be directly accessed. The software incorporates an emulation mode, in which the array performance is modeled in complete detail (including parameter spreads), with the data presented in identical format to that from the measured data. This allows theoretical performance to be compared directly with measured performance. The software also has the capability to perform bad pixel identification and substitution--a variety of algorithms are available--as well as detector gain/offset correction coefficients calculation.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles F. Walmsley, Timothy R. Beystrum, Charles Glasser, Ray Himoto, Mark K. Preis, Dave Parkinson, and Marcus L. Sutton "Characterization/test software for high-density IR focal planes", Proc. SPIE 4372, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII, (10 September 2001); https://doi.org/10.1117/12.439157
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