Paper
26 July 2001 PM noise measurements of an actively modelocked external-cavity semiconductor ring laser at 10 GHz
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Abstract
A novel approach to residual jitter measurement examines the intensity cross correlation generated by two optical pulses with various relative delays. A relative delay of 25 pulses produces a residual jitter value of 26 fsec RMS for a 10 GHZ actively mode-locked ring laser. The phase noise measurement carried out to the Nyquist frequency offset gives 47 fsec RMS pulse-to-pulse timing jitter. The field correlation measurement obtains a 10 asec RMS pulse-to-pulse optical carrier jitter.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tolga Yilmaz, Christopher M. DePriest, Peter J. Delfyett Jr., Joseph H. Abeles, and Alan Braun "PM noise measurements of an actively modelocked external-cavity semiconductor ring laser at 10 GHz", Proc. SPIE 4386, Photonic and Quantum Technologies for Aerospace Applications III, (26 July 2001); https://doi.org/10.1117/12.434226
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KEYWORDS
Phase measurement

Semiconductor lasers

Phase modulation

Semiconductors

Interferometers

Michelson interferometers

Optical amplifiers

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