You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
26 July 2001PM noise measurements of an actively modelocked external-cavity semiconductor ring laser at 10 GHz
A novel approach to residual jitter measurement examines the intensity cross correlation generated by two optical pulses with various relative delays. A relative delay of 25 pulses produces a residual jitter value of 26 fsec RMS for a 10 GHZ actively mode-locked ring laser. The phase noise measurement carried out to the Nyquist frequency offset gives 47 fsec RMS pulse-to-pulse timing jitter. The field correlation measurement obtains a 10 asec RMS pulse-to-pulse optical carrier jitter.
The alert did not successfully save. Please try again later.
Tolga Yilmaz, Christopher M. DePriest, Peter J. Delfyett Jr., Joseph H. Abeles, Alan Braun, "PM noise measurements of an actively modelocked external-cavity semiconductor ring laser at 10 GHz," Proc. SPIE 4386, Photonic and Quantum Technologies for Aerospace Applications III, (26 July 2001); https://doi.org/10.1117/12.434226