Paper
28 November 1983 High Speed M-B-M and M-I-S-I-M Detectors For Integrated Optics
Joel Wummer, T. K. Gustafson, Suwat Thanyavarin
Author Affiliations +
Abstract
Single and double junction surface structures have been investigated for ultra-fast integrated optical detection. The M-I-S-I-M lateral structure, M-B-M tunnelling and photo-emissive structures are discussed.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joel Wummer, T. K. Gustafson, and Suwat Thanyavarin "High Speed M-B-M and M-I-S-I-M Detectors For Integrated Optics", Proc. SPIE 0439, Picosecond Optoelectronics, (28 November 1983); https://doi.org/10.1117/12.966095
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KEYWORDS
Sensors

Electrodes

Picosecond phenomena

Quantum efficiency

Integrated optics

Silicon

Oxides

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