Picosecond Optical Electronic Measurements

Brian H. Kolner; David M. Bloom; Peter S. Cross

doi:10.1117/12.966087

28 November 1983 Picosecond Optical Electronic Measurements

Brian H. Kolner, David M. Bloom, Peter S. Cross

Proceedings Volume 0439, Picosecond Optoelectronics; (1983) https://doi.org/10.1117/12.966087
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

We report the development of an electro-optic sampling system and its application to the characterization of high speed GaAs Schottky photodiodes. This system achieves a temporal resolution of 2 ps and shot noise limited sensitivity of 11 μV√Hz.

Citation Download Citation

Brian H. Kolner, David M. Bloom, and Peter S. Cross "Picosecond Optical Electronic Measurements", Proc. SPIE 0439, Picosecond Optoelectronics, (28 November 1983); https://doi.org/10.1117/12.966087

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