Paper
22 October 2001 Virtual CMM using Monte Carlo methods based on frequency content of the error signal
Bas W. van Dorp, Han Haitjema, Frank Delbressine, Robbert H. Bergmans, Piet H. J. Schellekens
Author Affiliations +
Proceedings Volume 4401, Recent Developments in Traceable Dimensional Measurements; (2001) https://doi.org/10.1117/12.445616
Event: Lasers in Metrology and Art Conservation, 2001, Munich, Germany
Abstract
In coordinate measurement metrology, assessment of the measurement uncertainty of a particular measurement is not a straight forward task. A feasible way for calculation of the measurement uncertainty seems to be the use of a Monte Carlo method. In recent years, a number of Monte Carlo methods have been developed for this purpose, we have developed a Monte Carlo method that can be used on CMM's that takes into account, among other factors, the auto correlation of the error signal. We have separated the errors in linearity errors, rotational errors, straightness errors and squareness errors. Special measurement tools have been developed and applied to measure the required parameters. The short-wave as well as the long-wave behavior of the errors of a specific machine have been calibrated. A machine model that takes these effects into account is presented here. The relevant errors of a Zeiss Prismo were measured, and these data were used to calculate the measurement uncertainty of a measurement of a ring gauge. These calculations were compared to real measurements.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bas W. van Dorp, Han Haitjema, Frank Delbressine, Robbert H. Bergmans, and Piet H. J. Schellekens "Virtual CMM using Monte Carlo methods based on frequency content of the error signal", Proc. SPIE 4401, Recent Developments in Traceable Dimensional Measurements, (22 October 2001); https://doi.org/10.1117/12.445616
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Cited by 31 scholarly publications.
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KEYWORDS
Calibration

Monte Carlo methods

3D modeling

Temperature metrology

Computer simulations

Interferometers

Metrology

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