Paper
5 September 2001 Laser mask repair system LM700A
Atsushi Ueda, Yoichi Yoshino, Yukio Morishige, Syuichi Watanabe, Yukio Kyusho, Tsutoma Haneda, Makoto Ohmiya
Author Affiliations +
Abstract
High throughput laser mask repair system satisfying the accuracy demanded for 0.5micrometers pattern rule reticles has been newly developed. The named Laser Mask Repair LM700A has the following versatile features: *Opaque defect repair capability of 0.5micrometers L&S patterns with high repair accuracy of 45nm (3(sigma) ) *Low Quartz damage and high transmission at the repair site, especially for MoSi KrF-HT mask, and applicable to MoSi ArF-HT mask, by newly developed pico-second solid state UV pulse laser *0.1micrometers defect detectability by high resolution UV Optics *Through pellicle repair capability by newly developed long working distance UV objective lens *Auto-edge positioning function for various patterns By utilizing a pico-second UV pulse laser, very high quality laser zapping can be obtained. This paper presents the configuration and the evaluated results for mask repair performance in MoSi KrF-HT and ArF-HT masks.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Atsushi Ueda, Yoichi Yoshino, Yukio Morishige, Syuichi Watanabe, Yukio Kyusho, Tsutoma Haneda, and Makoto Ohmiya "Laser mask repair system LM700A", Proc. SPIE 4409, Photomask and Next-Generation Lithography Mask Technology VIII, (5 September 2001); https://doi.org/10.1117/12.438390
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KEYWORDS
Photomasks

Pulsed laser operation

Laser development

Laser systems engineering

Ultraviolet radiation

Objectives

Laser optics

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