PROCEEDINGS VOLUME 4412
INTERNATIONAL CONFERENCE ON SOLID STATE CRYSTALS 2000 | 9-13 OCTOBER 2000
International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals
INTERNATIONAL CONFERENCE ON SOLID STATE CRYSTALS 2000
9-13 October 2000
Zakopane, Poland
Bulk Crystal Growth
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 1 (10 August 2001); doi: 10.1117/12.435799
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 9 (10 August 2001); doi: 10.1117/12.435810
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Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 26 (10 August 2001); doi: 10.1117/12.435832
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 33 (10 August 2001); doi: 10.1117/12.435843
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Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 50 (10 August 2001); doi: 10.1117/12.435870
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 55 (10 August 2001); doi: 10.1117/12.435871
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Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 69 (10 August 2001); doi: 10.1117/12.435802
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 74 (10 August 2001); doi: 10.1117/12.435803
Silicon: Technology and Characterization
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 81 (10 August 2001); doi: 10.1117/12.435804
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 85 (10 August 2001); doi: 10.1117/12.435805
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 91 (10 August 2001); doi: 10.1117/12.435806
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 97 (10 August 2001); doi: 10.1117/12.435807
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 104 (10 August 2001); doi: 10.1117/12.435808
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 110 (10 August 2001); doi: 10.1117/12.435809
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 116 (10 August 2001); doi: 10.1117/12.435811
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 120 (10 August 2001); doi: 10.1117/12.435812
Crystal Physics, Ordering Processes
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 126 (10 August 2001); doi: 10.1117/12.435813
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 137 (10 August 2001); doi: 10.1117/12.435814
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 149 (10 August 2001); doi: 10.1117/12.435815
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Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 161 (10 August 2001); doi: 10.1117/12.435817
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 166 (10 August 2001); doi: 10.1117/12.435818
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 172 (10 August 2001); doi: 10.1117/12.435819
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 177 (10 August 2001); doi: 10.1117/12.435820
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Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 187 (10 August 2001); doi: 10.1117/12.435823
Structural, Optical, and Electrical Characterization of Crystalline Materials
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 191 (10 August 2001); doi: 10.1117/12.435824
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 196 (10 August 2001); doi: 10.1117/12.435825
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Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 236 (10 August 2001); doi: 10.1117/12.435833
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Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 272 (10 August 2001); doi: 10.1117/12.435841
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Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 289 (10 August 2001); doi: 10.1117/12.435846
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Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 323 (10 August 2001); doi: 10.1117/12.435853
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 331 (10 August 2001); doi: 10.1117/12.435855
Characterization and Application of Electro-Optical Materials
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 337 (10 August 2001); doi: 10.1117/12.435856
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 342 (10 August 2001); doi: 10.1117/12.435857
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 351 (10 August 2001); doi: 10.1117/12.435858
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 357 (10 August 2001); doi: 10.1117/12.435859
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 363 (10 August 2001); doi: 10.1117/12.435860
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 369 (10 August 2001); doi: 10.1117/12.435861
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 375 (10 August 2001); doi: 10.1117/12.435862
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Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 385 (10 August 2001); doi: 10.1117/12.435864
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 389 (10 August 2001); doi: 10.1117/12.435866
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 396 (10 August 2001); doi: 10.1117/12.435867
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 400 (10 August 2001); doi: 10.1117/12.435868
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, pg 406 (10 August 2001); doi: 10.1117/12.435869
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