10 August 2001 Analysis of the transient response of MIS circuits using pseudo-wavelet approach
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Abstract
This paper deals with the possibilities offered by the wavelet transform used in the analysis of the transient response of MIS circuits. This approach has certain advantages over the classical finite element or finite difference-based algorithms when applied to drift-diffusion model.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kazimierz Jerzy Plucinski, Kazimierz Jerzy Plucinski, } "Analysis of the transient response of MIS circuits using pseudo-wavelet approach", Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, (10 August 2001); doi: 10.1117/12.435853; https://doi.org/10.1117/12.435853
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