Investigation of defect levels in semi-insulating materials by modulated photocurrent (MPC)

J. Cwirko

doi:10.1117/12.425432

17 April 2001 Investigation of defect levels in semi-insulating materials by modulated photocurrent (MPC)

J. Cwirko

Proceedings Volume 4413, International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology; (2001) https://doi.org/10.1117/12.425432
Event: International Conference on Solid State Crystals 2000, 2000, Zakopane, Poland

Abstract

The modulated photo current measurements (MPC) are performed in frequency domain. The excess charge carriers are generated by light source, the intensity of which is sinusoidally modulated. The phase shift between excitation and photo current is dependent on the frequency and temperature. The parameters of defect levels are estimated from this shift.

Citation Download Citation

J. Cwirko "Investigation of defect levels in semi-insulating materials by modulated photocurrent (MPC)", Proc. SPIE 4413, International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (17 April 2001); https://doi.org/10.1117/12.425432

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