17 April 2001 Morphology and x-ray characterization of acenaphthene, fluoranthene, and pyrene crystals grown by sublimation
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Proceedings Volume 4413, International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology; (2001); doi: 10.1117/12.425465
Event: International Conference on Solid State Crystals 2000, 2000, Zakopane, Poland
Abstract
The preparation of relatively large of acenaphthene, fluoranthene and pyrene crystals grown from vapor phase by plate sublimation method, is described. In order to characterize the intrinsic structure perfection of such grown crystals the X-ray examinations have been performed. The observed morphologies of these crystals have been compared with that predicted from PBC theory by Hartman-Perdok, model growth conditions (vacuum, temperature gradient) effect have been assessed.
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Bernard Marciniak, Ewa Rozycka-Sokolowska, A. Balinska, W. Pawliuk, "Morphology and x-ray characterization of acenaphthene, fluoranthene, and pyrene crystals grown by sublimation", Proc. SPIE 4413, International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (17 April 2001); doi: 10.1117/12.425465; https://doi.org/10.1117/12.425465
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KEYWORDS
Crystals

X-rays

Copper

X-ray characterization

Cameras

Crystallography

Process control

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