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10 April 2001 Indentation creep and stress relaxation in amorphous As-S-Se and As-S films
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Proceedings Volume 4415, Optical Organic and Inorganic Materials; (2001) https://doi.org/10.1117/12.425511
Event: Advanced Optical Materials and Devices, 2000, Vilnius, United States
Abstract
The indentation creep in as-deposited and photopolymerized As- S-Se and As-S films has been investigated. The results show pronounced relaxation of mechanical stresses in the films at room temperature. The relationship (sigma) equals B (epsilon) m between the deformation rate and the stress is observed and the values of the deformation rate sensitivity exponent m < 1 are found. The creep rate was found to be dependent on deposition conditions of layers, applied indentation load, structural state of the material and light irradiation during the creep test.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Maniks, Ilze Manika, Janis Teteris, and R. Pokulis "Indentation creep and stress relaxation in amorphous As-S-Se and As-S films", Proc. SPIE 4415, Optical Organic and Inorganic Materials, (10 April 2001); https://doi.org/10.1117/12.425511
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