PROCEEDINGS VOLUME 4416
OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN '01) | 6-8 JUNE 2001
Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)
Editor(s): Koichi Iwata
OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN '01)
6-8 June 2001
Yokohama, Japan
Polarization Measurements
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 15 (8 May 2001); doi: 10.1117/12.426993
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Measurements of Mechanical Quantities
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 35 (8 May 2001); doi: 10.1117/12.427062
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Fiber Sensors I
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Fiber Sensors II
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 78 (8 May 2001); doi: 10.1117/12.427015
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Electronic Pattern Interferometry
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 94 (8 May 2001); doi: 10.1117/12.427020
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Digital Holography
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 112 (8 May 2001); doi: 10.1117/12.427026
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Low-Coherence Interferometry
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 128 (8 May 2001); doi: 10.1117/12.427030
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Interferometric Systems
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 144 (8 May 2001); doi: 10.1117/12.427035
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Fiber Gratings
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 166 (8 May 2001); doi: 10.1117/12.427040
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Photonic Materials
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 184 (8 May 2001); doi: 10.1117/12.427045
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Photonic Devices and Systems
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 194 (8 May 2001); doi: 10.1117/12.427047
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Sensing and Detection
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 215 (8 May 2001); doi: 10.1117/12.427051
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Fluid Measurements
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 236 (8 May 2001); doi: 10.1117/12.427056
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Poster Session
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 368 (8 May 2001); doi: 10.1117/12.427059
Imaging and Processing
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 252 (8 May 2001); doi: 10.1117/12.427060
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Image Systems
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 264 (8 May 2001); doi: 10.1117/12.427064
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Biological and Environmental Sensing
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 276 (8 May 2001); doi: 10.1117/12.427067
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Light Control
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 288 (8 May 2001); doi: 10.1117/12.427070
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Light Detectors
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 305 (8 May 2001); doi: 10.1117/12.427074
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Micro- and Nano-Optics
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 326 (8 May 2001); doi: 10.1117/12.427078
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Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 344 (8 May 2001); doi: 10.1117/12.427081
Micro- and Nano-Fabrication
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 348 (8 May 2001); doi: 10.1117/12.427083
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Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 364 (8 May 2001); doi: 10.1117/12.427086
Poster Session
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 372 (8 May 2001); doi: 10.1117/12.427087
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Polarization Measurements
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 1 (8 May 2001); doi: 10.1117/12.427021
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), pg 14 (8 May 2001); doi: 10.1117/12.427022
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