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8 May 2001 High-order birefringence and dispersion measurement using spectroscopy of polarized light
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Proceedings Volume 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001); (2001) https://doi.org/10.1117/12.427032
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '01), 2001, Yokohama, Japan
Abstract
This paper describes a method and device for measurement of two-dimensional retardance and dispersion with high-order and azimuthal direction. The system consists of a white light source, crossed polarizers and a detector for spectroscopic polarized light. A spectroscopic interferogram shows sinusoidal to wave number change, and its period changes slightly because of dispersion of birefringence. Fourier transform method is used to analyze the birefringence from the spectroscopic interferogram. One hundred and twenty-eight sets of images are used for birefringence analysis. Some results of 2D birefringence distribution with dispersion are shown for the demonstration.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Toshitaka Wakayama, Hiroyuki Kowa, Yukitoshi Otani, Norihiro Umeda, and Toru Yoshizawa "High-order birefringence and dispersion measurement using spectroscopy of polarized light", Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); https://doi.org/10.1117/12.427032
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