8 May 2001 Low-coherence tandem interferometer for in-situ measurement of the refractive index
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Proceedings Volume 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001); (2001) https://doi.org/10.1117/12.427034
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '01), 2001, Yokohama, Japan
Abstract
The low-coherence interferometric technique is proposed for the in-situ measurement of the refractive index of dispersive samples with high accuracy. A tandem configuration of a Michelson interferometer and a triangular interferometer is used to compensate for the chirping effect which results from the broad spectrum of the light source. Thick samples can be successfully measured with the low- coherence interferometer, therefore the relative accuracy of the refractive index can be improved.
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Akiko Hirai, Hirokazu Matsumoto, "Low-coherence tandem interferometer for in-situ measurement of the refractive index", Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); doi: 10.1117/12.427034; https://doi.org/10.1117/12.427034
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