8 May 2001 Nondestructive evaluation of surface-subsurface-combined defects using photoacoustic microscope
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Proceedings Volume 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001); (2001) https://doi.org/10.1117/12.426995
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '01), 2001, Yokohama, Japan
Abstract
The imaging of the simulated surface-subsurface combined defect using photoacoustic microscope has been demonstrated. Simulated surface and subsurface defects are fabricated independently such that the former was drilled on a pure aluminum plate whereas the latter was machined with end mill. Specimen with subsurface defect alone was also carried out. The photoacoustic image obtained clearly showed the location and the size of both subsurface defect and the surface-subsurface combined defect. The photoacoustic method is useful for detection of the combined defect which is difficult to detect with present NDE techniques.
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Haruo Endoh, Naoto Yaegashi, Yoichiro Hiwatashi, Tsutomu Hoshimiya, "Nondestructive evaluation of surface-subsurface-combined defects using photoacoustic microscope", Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); doi: 10.1117/12.426995; https://doi.org/10.1117/12.426995
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