8 May 2001 Phase-shifting interference microscopy using a Fresnel's biprism
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Proceedings Volume 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001); (2001); doi: 10.1117/12.427038
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '01), 2001, Yokohama, Japan
We present a new type of phase-shifting microscope that enables us to quantitatively measure the phase distribution of a transparent microscopic object. In this microscope, a Fresnel's biprism is used to make the object wave and a reference wave to interfere. The biprism is laterally moved by a piezoelectric transducer to produce the phase shift between the two waves required for phase extraction using the phase shifting technique. The diffraction caused by the vertex of the biprism is avoided by placing a thin wire at the center position of an intermediate image plane. The technique described here can be easily applied to an ordinary optical microscope, moreover, this technique can also be applied to an electron holographic interference microscope using an electron biprism. Experimental results for measuring the refractive index distribution of an optical waveguide are presented.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jun Chen, Junji Endo, Yoshiaki Niino, Hiroyuki Fujita, "Phase-shifting interference microscopy using a Fresnel's biprism", Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); doi: 10.1117/12.427038; https://doi.org/10.1117/12.427038

Phase shifts



Phase measurement



Optical engineering

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