8 May 2001 Study of the mechanism of the light-scattering-mode superresolution near-field structure
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Proceedings Volume 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001); (2001) https://doi.org/10.1117/12.427055
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '01), 2001, Yokohama, Japan
Abstract
The near-field recording mechanism of the super resolution near-field structure, glass/ZnS-SiO2/AgOx/ZnS-SiO2, has been studied experimentally. Near-field optical effects of the glass/ZnS-SiO2/AgOx/ZnS-SiO2 have been observed by a tapping mode tuning-fork near-field scanning optical microscope (TMTF-NSOM) on the transmitting light spot. Laser-excited surface plasmon at the interfaces of AgOx/ZnS-SiO2 thin film was detected by this technique. Results showed that the transmitting focused light through the AgOx type super resolution near-field structure consists of a propagating term and an evanescent one resulted from the localized surface plasmon of the AgOx thin film. A strong enhancement of the near-field intensity and the dynamic localized enhancement of the transmitting focused light were observed as well.
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Wei Chih Lin, Wei Chih Lin, Jun Dar Su, Jun Dar Su, Ming Chun Tsai, Ming Chun Tsai, Din Ping Tsai, Din Ping Tsai, Nien Hua Lu, Nien Hua Lu, Hung Ji Huang, Hung Ji Huang, Wei Yi Lin, Wei Yi Lin, } "Study of the mechanism of the light-scattering-mode superresolution near-field structure", Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); doi: 10.1117/12.427055; https://doi.org/10.1117/12.427055
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