14 August 2001 Measurement of fractal characteristics in binary texture distributions
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Proceedings Volume 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications; (2001) https://doi.org/10.1117/12.437185
Event: IV Iberoamerican Meeting of Optics and the VII Latin American Meeting of Optics, Lasers and Their Applications, 2001, Tandil, Argentina
Abstract
In this work, we superimpose tow and more random images of irregular particles, using different statistics and concentration for the texture distributions. This is achieved using different random generators to obtain binary images in the distribution of these particles. For these case, the box counting dimension is calculated and we obtain the relation between this dimension and the corresponding structure. In this way, we obtain a fractal characterization for the superposition of these binary images.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fernando Manzano Licona, Diana Calva Mendez, Mario Garavaglia, Mario Marcelo Lehman, "Measurement of fractal characteristics in binary texture distributions", Proc. SPIE 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, (14 August 2001); doi: 10.1117/12.437185; https://doi.org/10.1117/12.437185
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