11 September 2001 Portable residual stresses measurement device using ESPI and a radial in-plane interferometer
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Proceedings Volume 4420, Laser Metrology for Precision Measurement and Inspection in Industry; (2001) https://doi.org/10.1117/12.439201
Event: Laser Metrology for Precision Management and Inspection in Industry, 2001, Florianopolis, Brazil
Abstract
This paper presents a new kind of double illumination interferometer used for radial in-plane displacement measurement through electronic speckle pattern interferometry (ESPI). Some characteristics and implementation details are discussed. This new interferometer is used for residual stresses measurement combining, in a very efficient way, the blind hole method and the in-plane radial displacement measurement by ESPI. Algorithms and implementation characteristics are also discussed. A portable device was built to measure residual stress outside the optical bench. Early results show a measurement performance comparable to the conventional blind hole method using strain gages. Measurement time is almost one order less than the strain gage based measurement system.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Armando Albertazzi, Cesar Kanda, Maikon R. Borges, Frank Hrebabetzky, "Portable residual stresses measurement device using ESPI and a radial in-plane interferometer", Proc. SPIE 4420, Laser Metrology for Precision Measurement and Inspection in Industry, (11 September 2001); doi: 10.1117/12.439201; https://doi.org/10.1117/12.439201
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