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11 September 2001 Sources of error in absolute distance interferometry
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Proceedings Volume 4420, Laser Metrology for Precision Measurement and Inspection in Industry; (2001)
Event: Laser Metrology for Precision Management and Inspection in Industry, 2001, Florianopolis, Brazil
In this paper we describe the status of our research on the use of diode lasers for absolute distance interferometry, and we discuss the major sources of uncertainty that limit the accuracy of this technique for distance measurement. We have primarily employed a 670 nm external cavity diode laser as the tunable source for our interferometer, but currently, we are developing a system based on an 850 nm distributed Bragg reflector laser. These two laser have very different strengths and weaknesses; the primary sources of uncertainty in length measurement depend on which laser is employed.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jack A. Stone, A. Stejskal, and Lowell P. Howard "Sources of error in absolute distance interferometry", Proc. SPIE 4420, Laser Metrology for Precision Measurement and Inspection in Industry, (11 September 2001);

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