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23 April 2001 Warm dense plasma characterization by x-ray Thomson scattering
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Proceedings Volume 4424, ECLIM 2000: 26th European Conference on Laser Interaction with Matter; (2001) https://doi.org/10.1117/12.425572
Event: 26th European Conference on Laser Interaction with Matter (ECLIM 2000), 2000, Prague, Czech Republic
Abstract
We describe how the powerful technique of spectrally resolved Thomson scattering can be extended to the x-ray regime, for direct measurements of the ionization state, density, temperature, and the microscopic behavior of dense cool plasmas. Such a direct measurement of microscopic parameters of solid density plasmas could eventually be used to properly interpret laboratory measurements of material properties such as thermal and electrical conductivity, EOS and opacity. In addition, x-ray Thomson scattering will provide new information on the characteristics of hitherto difficult to diagnose Fermi degenerate and strongly coupled plasmas.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Otto L. Landen, S. H. Glenzer, Robert C. Cauble, Richard W. Lee, M. J. Edwards, and J. S. DeGroot "Warm dense plasma characterization by x-ray Thomson scattering", Proc. SPIE 4424, ECLIM 2000: 26th European Conference on Laser Interaction with Matter, (23 April 2001); https://doi.org/10.1117/12.425572
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