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25 February 2002 Laser microbumping and contamination-free tagging on magnetic hard disk surfaces: techniques and applications
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Proceedings Volume 4426, Second International Symposium on Laser Precision Microfabrication; (2002) https://doi.org/10.1117/12.456830
Event: Second International Symposium on Laser Precision Micromachining, 2001, Singapore, Singapore
Abstract
Laser micro-bumping and contamination-free tagging magnetic hard disk surfaces had been intensively investigated. Diode- pumped Nd:YVO4 laser with fundamental output was used for microbumping on NiP surface and contamination-free tagging on finished disk surface. Atomic force microscopy and Auger electron spectroscopy were employed to analyse processed samples. Processing results versus laser parameters were studied and optimized in detail. Based on the research, the techniques were commercialized subsequently. In this paper, we present our experimental results and introduce their applications.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
DaMing Liu, Teng Soon Wee, Yuan Yuan, Yongfeng Lu, Minghui Hong, and Ryan J. K. Goh "Laser microbumping and contamination-free tagging on magnetic hard disk surfaces: techniques and applications", Proc. SPIE 4426, Second International Symposium on Laser Precision Microfabrication, (25 February 2002); https://doi.org/10.1117/12.456830
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