Paper
25 February 2002 Laser thinning of the thickness of a-GeS2 films
Shuichi Kawabata, Yoshihisa Murakami, Yasunori Ozawa, Moriaki Wakaki
Author Affiliations +
Proceedings Volume 4426, Second International Symposium on Laser Precision Microfabrication; (2002) https://doi.org/10.1117/12.456864
Event: Second International Symposium on Laser Precision Micromachining, 2001, Singapore, Singapore
Abstract
The amorphous GeS2 film is one of the chalcogenide glass and also shows the phenomenon of Ag-photodoping under the illumination of the high-pressure mercury lamp. We have been carrying out the in-situ measurements of the photodoping process of Ag/a-GeS2 films system with a laser probe ellipsometer. In the process of the thickness measurements, we have observed curious changes of ellipsometric parameters (delta) and (Psi) of the GeS2 film sample during the illumination of the laser probe. The results seem to be suggesting that the illumination of the laser beam might engrave the GeS2 film. The power of the laser is less than 1mW and the beam diameter is 1mm. The idea such as an ablation of the GeS2 film seems to be unlikely to interpret this phenomenon.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shuichi Kawabata, Yoshihisa Murakami, Yasunori Ozawa, and Moriaki Wakaki "Laser thinning of the thickness of a-GeS2 films", Proc. SPIE 4426, Second International Symposium on Laser Precision Microfabrication, (25 February 2002); https://doi.org/10.1117/12.456864
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KEYWORDS
Glasses

Chalcogenide glass

Refractive index

Helium neon lasers

Ellipsometry

Germanium

Laser beam diagnostics

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