5 November 2001 Design and detection of superprecision positioning stage with nanometer resolution
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A precision positioning system with a high displacement resolution has been widely required for modern industrialized applications, such as microelectronics, super-precision manufacturing etc. This paper discusses the design and the features of a new piezo driven precision micro positioning stage utilizing flexure hinges. Theoretical analysis for the stiffness of the flexure hinge is also given briefly. A piezoelectric ceramic is applied to drive the precision state, whose displacement can reach 5 micrometers when employed with 1000 voltage power. In order to testify the robust and measurement stability of the precision sta, three kinds of PZT produced in Germany, Japan and China respectively are utilized. A dual-frequency interferometer with nanometer resolution and accuracy is adopted to evaluate the mechanical characteristics of the positioning stage. The experimental result shows that the open loop control of the stage provides 0.2nm positioning resolution along the moving direction.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chunyong Yin, Dejiao Lin, Jian Wu, Rui Zhang, "Design and detection of superprecision positioning stage with nanometer resolution", Proc. SPIE 4444, Optomechanical Design and Engineering 2001, (5 November 2001); doi: 10.1117/12.447317; https://doi.org/10.1117/12.447317


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