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Fabrication of one-dimensional random surfaces that display enhanced backscattering for only one specified angle of incidence
Excitation of surface plasmon polaritons by the scattering of a volume electromagnetic beam from a circularly symmetric defect on a planar metal surface
Phase-shifting interference microscope for the characterization of metallic interconnections of flat panel displays
Metrological characterization of an ARS sensor based on an elliptical mirror system and a calibrated CMOS photo detector array
Measuring correlation between speckle patterns reflected from rough surfaces at different wavelengths by adaptive photo-EMF detector