27 December 2001 High-precision 2D angle measurement using fringe analysis techniques
Author Affiliations +
Abstract
In this paper, a novel angle measurement method using the fringe analysis techniques is proposed. In this method, a 2D surface profile including a tilt is obtained by fringe analysis, and the tilt in the 2D surface profile is determined by fitting the obtained surface profile with a plane. From the fitted plane, 2D angles can be easily obtained. Simulations using the Fourier transform and phase- shift methods are performed, and the results are compared with each other. Simulations show that 2D angle measurement using the fringe analysis techniques can achieve simultaneously a wide measurement range and high precision.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zongtao Ge, Zongtao Ge, Takayuki Saito, Takayuki Saito, Shinichi Matsuda, Shinichi Matsuda, Mitsuo Takeda, Mitsuo Takeda, } "High-precision 2D angle measurement using fringe analysis techniques", Proc. SPIE 4451, Optical Manufacturing and Testing IV, (27 December 2001); doi: 10.1117/12.453643; https://doi.org/10.1117/12.453643
PROCEEDINGS
10 PAGES


SHARE
RELATED CONTENT

Rapid Target Locator
Proceedings of SPIE (December 22 1985)
Self-reference method for phase-shift interferometry
Proceedings of SPIE (May 07 2001)
Coordinate transform method for closed fringe analysis
Proceedings of SPIE (March 06 2006)
3D shape measurement based on Hilbert transform
Proceedings of SPIE (August 18 2011)

Back to Top