9 July 2001 Microscopic model for static and dynamic loading of chiral sculptured thin films
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Abstract
The localized homogenization framework, the Mori-Tanaka average stress and the Eshelby tensor for ellipsoids are used to estimate the elastic constitutive properties of chiral sculptured thin films from their microstructural details. The devised model contains five arbitrary parameters, whose values can be decided upon by suitable experimentation. The responses of a chiral STF to static and dynamic loading along the axis of nonhomogeneity are presented.
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Akhlesh Lakhtakia, Akhlesh Lakhtakia, } "Microscopic model for static and dynamic loading of chiral sculptured thin films", Proc. SPIE 4467, Complex Mediums II: Beyond Linear Isotropic Dielectrics, (9 July 2001); doi: 10.1117/12.432924; https://doi.org/10.1117/12.432924
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