PROCEEDINGS VOLUME 4468
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 29 JULY - 3 AUGUST 2001
Engineering Thin Films with Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing
IN THIS VOLUME

2 Sessions, 19 Papers, 0 Presentations
Section  (17)
Proceedings Volume 4468 is from: Logo
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
29 July - 3 August 2001
San Diego, CA, United States
Section
Proc. SPIE 4468, Ion beam modification of perpendicular magnetic anisotropy in (Co/Pt)n multilayers and FePt thin films, 0000 (27 December 2001); doi: 10.1117/12.452551
Proc. SPIE 4468, Metal oxide films with magnetically modulated nanoporous architectures, 0000 (27 December 2001); doi: 10.1117/12.452555
Proc. SPIE 4468, Ion beam nanosmoothing of sapphire and silicon carbide surfaces, 0000 (27 December 2001); doi: 10.1117/12.452556
Proc. SPIE 4468, Time-resolved studies of photoluminescence from proton irradiated and thermally annealed a-SiC:H alloys, 0000 (27 December 2001); doi: 10.1117/12.452557
Proc. SPIE 4468, Highly charged ion-secondary ion mass spectrometry (HCI-SIMS): toward metrology solutions for sub-100-nm technology nodes, 0000 (27 December 2001); doi: 10.1117/12.452558
Proc. SPIE 4468, Structural analysis of chalcogenide waveguides using Rutherford backscattering spectroscopy (RBS), 0000 (27 December 2001); doi: 10.1117/12.452559
Proc. SPIE 4468, In-line methods of optical diagnostics in the field of standardization and metrology, 0000 (27 December 2001); doi: 10.1117/12.452560
Proc. SPIE 4468, Forensic applications of ion-beam mixing and surface spectroscopy of latent fingerprints, 0000 (27 December 2001); doi: 10.1117/12.452561
Proc. SPIE 4468, Mass-transport driven by atomic relocations under high-flux ion irradiation at elevated temperatures, 0000 (27 December 2001); doi: 10.1117/12.452543
Proc. SPIE 4468, Low-energy ion implantation-induced control of InP-based heterostructure properties, 0000 (27 December 2001); doi: 10.1117/12.452544
Proc. SPIE 4468, Magnesium film implanted with vanadium ions for hydrogen storage, 0000 (27 December 2001); doi: 10.1117/12.452545
Proc. SPIE 4468, Purification and processing of carbon nanotubes using self-assembly and selective interaction with a semiconjugated polymer, 0000 (27 December 2001); doi: 10.1117/12.452546
Proc. SPIE 4468, In-situ biaxial texture analysis of MgO films during growth on amorphous substrates by ion-beam-assisted deposition, 0000 (27 December 2001); doi: 10.1117/12.452547
Proc. SPIE 4468, Effects of nitrogen plasma immersion ion implantation in silicon, 0000 (27 December 2001); doi: 10.1117/12.452548
Proc. SPIE 4468, Nanoscale-level dielectric property image of low-k dielectric materials for copper metallization using energy-filtered TEM, 0000 (27 December 2001); doi: 10.1117/12.452549
Proc. SPIE 4468, Using scanning probe microscopy and nanomoter surface profiler of DEDTAK for determination of thermal stress in quasi-monolithic integration technology (QMIT), 0000 (27 December 2001); doi: 10.1117/12.452550
Proc. SPIE 4468, Dual-fiber optic microcantilever proximity sensor, 0000 (27 December 2001); doi: 10.1117/12.452552
Poster Session
Proc. SPIE 4468, Detection of metal fatigue by laser-instituted thermal vibration, 0000 (27 December 2001); doi: 10.1117/12.452553
Proc. SPIE 4468, Electrostatic self-assembly processing of functional nanocomposites, 0000 (27 December 2001); doi: 10.1117/12.452554
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