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31 October 2001 Raman characterization of Te inclusions on CdTe surfaces using visible lasers
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In this work, we report the behavior of the CdTe surface studied by micro-Raman. The micro-Raman measurements were performed with different laser lines in regions of both transparency and opacity, using infrared and visible lasers respectively. Visible radiation leads to the formation of Te on the irradiated surface compromising any conclusion about the presence of Te inclusions in CdTe, a subject of controversy. We show that the power density and local temperature is directly connected with the intensity of Te modes on the irradiated surface. In this context, the increase of excitation power and exposure time of the sample surface accelerates the process. We also show that the process is too fast to allow, in most cases, for real time characterization. Nevertheless in this work, it was possible to observe the growth of the Te optical modes during the measurement process by rigorous optical control of the beam characteristics and optical density. This result is the same in all random spectra obtained from different sample locations. We noticed that previously other authors irradiated CdTe and HgCdTe films with a nanosecond pulsed Ruby laser and attributed the decrease in electrical resistivity to the growth of a Te layer on the surface of the CdTe. Our work is a direct evidence for this result.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jorge Soares and Celeste do Carmo "Raman characterization of Te inclusions on CdTe surfaces using visible lasers", Proc. SPIE 4469, Raman Spectroscopy and Light Scattering Technologies in Materials Science, (31 October 2001);


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