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9 January 2002 Performance of reflection polarizers using bare semiconductor substrates in the visible and UV spectral range
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Abstract
Performance of reflection polarizers using bare semiconductor substrates in the visible and UV spectral range is presented. Performance evaluation based on extinction ratio, throughput, and sensitivity to angular and spectral variations of Si and Ge reflection polarizers are considered.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aed M. El-Saba and Rasheed M. A. Azzam "Performance of reflection polarizers using bare semiconductor substrates in the visible and UV spectral range", Proc. SPIE 4481, Polarization Analysis and Measurement IV, (9 January 2002); https://doi.org/10.1117/12.452872
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