Abstract
Well-characterized test conditions are essential for validating the engineering design of an adaptive optical system. A technique for fabricating high-resolution, well- characterized pseudo-random phase plates that addresses this need is described. Among other uses, these phase plates can be used to test adaptive optics systems under controlled conditions. Machining a surface whose relief height is proportional to the desired phase forms a pixellated phase plate. Using Lexitek's Near-Index-MatchTM approach, a sandwich of two materials is formed that produces the desired phase. Phase plates with 20 micron pixels have been fabricated using a 4096 X 4096 pixel grid. Results are presented.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steven M. Ebstein, Steven M. Ebstein, } "Pseudo-random phase plates", Proc. SPIE 4493, High-Resolution Wavefront Control: Methods, Devices, and Applications III, (1 February 2002); doi: 10.1117/12.454707; https://doi.org/10.1117/12.454707
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