High-energy characterization of multilayers for hard x-ray astronomy

Adrian Ivan; Ricardo J. Bruni; Stephen B. Cenko; Paul Gorenstein; Suzanne E. Romaine

doi:10.1117/12.454366

30 January 2002 High-energy characterization of multilayers for hard x-ray astronomy

Adrian Ivan, Ricardo J. Bruni, Stephen B. Cenko, Paul Gorenstein, Suzanne E. Romaine

Proceedings Volume 4496, X-Ray Optics for Astronomy: Telescopes, Multilayers, Spectrometers, and Missions; (2002) https://doi.org/10.1117/12.454366
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

We report the results obtained during the second phase of a program which consists of comparing the performance of different multilayer material combinations. These coatings will be used to extend the bandpass of current hard X-ray optics toward 100 keV, an order of magnitude higher than present technology. The materials studied here are W/Si, Pt/C, and W/C. A comparison of the performance of depth graded multilayers of these different materials at energies 30-80 keV was undertaken. Specular reflectivity data were acquired at 30-80 keV using the X17B1 beamline of the National Synchrotron Light Source. Reflectivity versus energy plots showed a high enough reflectivity for the bandpass of interest at grazing angles typical for hard x-ray telescope mirror shells. The next phase of our program will continue with similar high-energy pencil beam measurements on multilayer coated telescope prototype shells.

Citation Download Citation

Adrian Ivan, Ricardo J. Bruni, Stephen B. Cenko, Paul Gorenstein, and Suzanne E. Romaine "High-energy characterization of multilayers for hard x-ray astronomy", Proc. SPIE 4496, X-Ray Optics for Astronomy: Telescopes, Multilayers, Spectrometers, and Missions, (30 January 2002); https://doi.org/10.1117/12.454366

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