A progress report on the work, started ten months ago, aimed to evaluate the use of a new type of position sensor (Complementary Metal Oxide Semiconductor Active Pixel Sensor or CMOS-APS) as readout system in MCP-based intensified photon counting systems, is presented in this paper. The main differences respect to the more classical Photon Counting Intensified CCDs (PC-ICCD), the advantages and the disadvantages of their use as image photon counters, the adopted solutions to acquire the images and compute the photon event center, are described. The adopted optics and the designed mechanical assembly are also shown. The selected CMOS-APS, heart of the system, is treated in detail, as well as the electronics designed to drive the detector, to compute the center of the luminous spot on the MCP phosphor screen, and to send and receive data from a host computer. Finally we present preliminary results and achieved performances.