PROCEEDINGS VOLUME 4499
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 29 JULY - 3 AUGUST 2001
X-Ray Micro- and Nano-Focusing: Applications and Techniques II
IN THIS VOLUME

5 Sessions, 16 Papers, 0 Presentations
Applications  (2)
Detectors  (2)
Proceedings Volume 4499 is from: Logo
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
29 July - 3 August 2001
San Diego, CA, United States
Applications
Proc. SPIE 4499, Imaging buried magnetic domains using hard x rays, 0000 (13 December 2001); doi: 10.1117/12.450228
Proc. SPIE 4499, Development and application of a focused ultrasoft x-ray probe for radiobiological applications, 0000 (13 December 2001); doi: 10.1117/12.450232
Imaging Systems and Techniques
Proc. SPIE 4499, X-ray microdiffraction study of martensite-retained austenite microstructures at the tip of a steel blade, 0000 (13 December 2001); doi: 10.1117/12.450233
Proc. SPIE 4499, Current and ultimate limitations of scanning x-ray nanotomography, 0000 (13 December 2001); doi: 10.1117/12.450234
Proc. SPIE 4499, X-ray imaging microscope with a partial coherent illumination, 0000 (13 December 2001); doi: 10.1117/12.450219
Proc. SPIE 4499, Wide-field x-ray microscopy with Kirkpatrick-Baez optics, 0000 (13 December 2001); doi: 10.1117/12.450220
Proc. SPIE 4499, New XRMF spectrometer with high resolution and high efficiency using polycapillary x-ray lens and PSPC+, 0000 (13 December 2001); doi: 10.1117/12.450221
Focusing Optics
Proc. SPIE 4499, Microbeam production using compound refractive lenses: beam characterization and applications, 0000 (13 December 2001); doi: 10.1117/12.450222
Proc. SPIE 4499, Refractive and diffractive x-ray optical elements, 0000 (13 December 2001); doi: 10.1117/12.450223
Proc. SPIE 4499, Diffraction-limited microbeam with Fresnel zone plate optics in hard x-ray regions, 0000 (13 December 2001); doi: 10.1117/12.450224
Proc. SPIE 4499, Diffractive lenses for photon energies ranging from the extreme ultraviolet to hard x rays, 0000 (13 December 2001); doi: 10.1117/12.450225
Proc. SPIE 4499, Tunable diffractive optical elements for hard x-rays, 0000 (13 December 2001); doi: 10.1117/12.450226
Proc. SPIE 4499, Submicron focusing of hard x rays with reflecting surfaces at the ESRF, 0000 (13 December 2001); doi: 10.1117/12.450227
Detectors
Proc. SPIE 4499, Novel integrating solid state detector with segmentation for scanning transmission soft x-ray microscopy, 0000 (13 December 2001); doi: 10.1117/12.450229
Proc. SPIE 4499, PSF measurement of imaging detectors with an x-ray microbeam, 0000 (13 December 2001); doi: 10.1117/12.450230
Poster Session
Proc. SPIE 4499, Experimental analysis of high-resolution soft x-ray microscopy, 0000 (13 December 2001); doi: 10.1117/12.450231
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