13 December 2001 Novel integrating solid state detector with segmentation for scanning transmission soft x-ray microscopy
Author Affiliations +
An integrating solid state detector with segmentation has been developed that addresses the needs in scanning transmission x-ray microscopy below 1 keV photon energy. The detector is not cooled and can be operated without an entrance window which leads to a total photon detection efficiency close to 100%. The chosen segmentation with 8 independent segments is matched to the geometry of the STXM to maximize image mode flexibility. In the bright field configuration for 1 ms integration time and 520 eV x-rays the rms noise is 8 photons per integration.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael Feser, Michael Feser, Chris J. Jacobsen, Chris J. Jacobsen, Pavel Rehak, Pavel Rehak, Gianluigi DiGeronimo, Gianluigi DiGeronimo, Peter Holl, Peter Holl, Lothar Strueder, Lothar Strueder, } "Novel integrating solid state detector with segmentation for scanning transmission soft x-ray microscopy", Proc. SPIE 4499, X-Ray Micro- and Nano-Focusing: Applications and Techniques II, (13 December 2001); doi: 10.1117/12.450229; https://doi.org/10.1117/12.450229


Silicon drift chamber with extended energy range
Proceedings of SPIE (December 12 2000)
Silicon x-ray array detector on spectrum-x-gamma satellite
Proceedings of SPIE (September 30 1991)
Solid-State 1024 Pixel Linear X-Ray Detector
Proceedings of SPIE (August 02 1987)
Digital Radiology With A Slit Scan Detector
Proceedings of SPIE (April 30 1989)
Silicon pixel detector for x-ray spectroscopy
Proceedings of SPIE (November 09 1998)
Development of a silicon drift detector array an x...
Proceedings of SPIE (September 03 2009)

Back to Top