Optics for coherent x-ray sources

Richard H. Pantell; Joseph Feinstein; J. Theodore Cremer; Melvin A. Piestrup; H. Raul Beguiristain; Charles K. Gary

doi:10.1117/12.452968

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28 December 2001 Optics for coherent x-ray sources

Richard H. Pantell; Joseph Feinstein; J. Theodore Cremer; Melvin A. Piestrup; H. Raul Beguiristain; Charles K. Gary

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Proceedings Volume 4500, Optics for Fourth-Generation X-Ray Sources; (2001) https://doi.org/10.1117/12.452968
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Several laboratories are now in the process of designing and constructing coherent x-ray sources, and application of these beams for radiography and material studies is facilitated by having appropriate optical components to provide collimation or focusing. Control of x-rays can be achieved by employing elements that perform refraction, diffraction or reflection, as exemplified by a lens, grating or mirror, respectively. Of course, the maximum intensity of minimum image size that is obtainable from any of these elements is determined by diffraction effects. Using the parameters of the Liinac Coherent Light Source (LCLS) being studied at the Stanford Synchrotron Radiation Laboratory (SSRL), x-ray optical components can increase the beam intensity approximately eight orders of magnitude and provide submicron images. Performance comparisons are made between the zone plate, the phase zone plate, the compound refractive lens, the Fresnel compound refractive lens, and the parabolic mirror.

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Richard H. Pantell, Joseph Feinstein, J. Theodore Cremer, Melvin A. Piestrup, H. Raul Beguiristain, and Charles K. Gary "Optics for coherent x-ray sources", Proc. SPIE 4500, Optics for Fourth-Generation X-Ray Sources, (28 December 2001); https://doi.org/10.1117/12.452968