Measurements of the integrated reflectivity of a mica crystal for different orders of reflection

Sang Gon Lee; Jun Gyo Bak; Yeong Su Jung; Manfred Bitter; K. W. Hill; O. Wehrhan; Eckhart Foerster

doi:10.1117/12.448492

14 November 2001 Measurements of the integrated reflectivity of a mica crystal for different orders of reflection

Sang Gon Lee, Jun Gyo Bak, Yeong Su Jung, Manfred Bitter, K. W. Hill, O. Wehrhan, Eckhart Foerster

Proceedings Volume 4501, X-Ray Mirrors, Crystals, and Multilayers; (2001) https://doi.org/10.1117/12.448492
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Simultaneous measurements of the integrated reflectivity of a mica crystal for different orders of reflection have been performed at a predefined Bragg angle of 45 degree(s) with use of a new method. The method is less time consuming than previous techniques and provides data with small statistical errors. It can be readily used for the calibration of x-ray crystal spectrometers. The paper presents experimental results for Bragg reflections up to the 22^nd order. The obtained experimental results are compared with theoretical predictions.

Citation Download Citation

Sang Gon Lee, Jun Gyo Bak, Yeong Su Jung, Manfred Bitter, K. W. Hill, O. Wehrhan, and Eckhart Foerster "Measurements of the integrated reflectivity of a mica crystal for different orders of reflection", Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, (14 November 2001); https://doi.org/10.1117/12.448492

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