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14 November 2001 Measurements of the integrated reflectivity of a mica crystal for different orders of reflection
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Abstract
Simultaneous measurements of the integrated reflectivity of a mica crystal for different orders of reflection have been performed at a predefined Bragg angle of 45 degree(s) with use of a new method. The method is less time consuming than previous techniques and provides data with small statistical errors. It can be readily used for the calibration of x-ray crystal spectrometers. The paper presents experimental results for Bragg reflections up to the 22nd order. The obtained experimental results are compared with theoretical predictions.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sang Gon Lee, Jun Gyo Bak, Yeong Su Jung, Manfred Bitter, K. W. Hill, O. Wehrhan, and Eckhart Foerster "Measurements of the integrated reflectivity of a mica crystal for different orders of reflection", Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, (14 November 2001); https://doi.org/10.1117/12.448492
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