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7 January 2002 Analytical simulator for Compton tomographic measurements
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Abstract
A critical point of several reconstruction and analysis algorithms in x-ray experiments is a fast simulation of the interaction of radiation with matter. This kind of simulation is usually based on Monte Carlo techniques, which follows each particle individual trajectory. Since the maximum number of interactions is a user-definable integer, Monte Carlo simulations allow to obtain an arbitrary precision. However, in several experiments the flux of photons that reach the detector after the interaction in the volume of interest (VOI) is very low, therefore the simulation time may be very large. Simple experiments of x- ray tomography may require several days to obtain reasonable statistics with the faster Monte Carlo codes. Particularly, in x-y scanning tomography both the detector and the x-ray tube are highly collimated. In such cases, conventional Monte Carlo techniques are inadequate. As a possible alternative, we propose an analytical spectrum generator, which evaluates the detected signal through the differential cross section for the single interaction with corrections for absorption of the beam (before the interaction point) and of the scattered photon (after the interaction point). It will be shown that the analytical projector proposed in this paper is several order faster than Monte Carlo based simulators.
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Antonio Brunetti, Bruno Golosio, Roberto Cesareo, and Cesare Cappio Borlino "Analytical simulator for Compton tomographic measurements", Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); https://doi.org/10.1117/12.452860
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