7 January 2002 Improvement of spatial resolution in phase-contrast x-ray computed tomography
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Abstract
Image quality of phase-contrast x-ray computed tomogram was evaluated by comparing tomograms obtained by using triple Laue-case x-ray interferometers with a thin or a thick crystal wafer. It was confirmed that the spatial resolution was improved when the wafer is thinned. A simulation study by means of the Takagi-Taupin equation was also carried out for theoretical understanding. According to the wavefront modulation transfer function calculated for Laue-case diffraction, it is suggested that using an interferometer with al thin wafer tends to improve image quality. However, a new problem is pointed out that the accuracy in quantitative measurement of high-frequency phase modulation is not secured even when the wafer is thinned.
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Atsushi Momose, Atsushi Momose, Ichiro Koyama, Ichiro Koyama, Keiichi Hirano, Keiichi Hirano, } "Improvement of spatial resolution in phase-contrast x-ray computed tomography", Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); doi: 10.1117/12.452871; https://doi.org/10.1117/12.452871
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