14 November 2001 Femtosecond solid-liquid phase transition studied with ultrafast x-ray diffraction
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We have characterized the ultrafast solid-liquid transition of InSb and CdTe semiconductors by time resolved x-ray diffraction in the femtosecond timescale. Visible spectroscopic data were obtained together with x-ray measurements to characterize the dense electron-ho9le plasma at the origin of the phase transition following the IR excitation.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Fourmaux, S. Fourmaux, Antoine Rousse, Antoine Rousse, Christian Rischel, Christian Rischel, Ingo Uschmann, Ingo Uschmann, Stephane Sebban, Stephane Sebban, Philippe Balcou, Philippe Balcou, G. Grillon, G. Grillon, Eckhart Forster, Eckhart Forster, Jean-Claude J. Gauthier, Jean-Claude J. Gauthier, Daniele Hulin, Daniele Hulin, } "Femtosecond solid-liquid phase transition studied with ultrafast x-ray diffraction", Proc. SPIE 4504, Applications of X Rays Generated from Lasers and Other Bright Sources II, (14 November 2001); doi: 10.1117/12.448474; https://doi.org/10.1117/12.448474

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