Paper
14 November 2001 Intense XUV source of radiation within the 4- to 45-nm spectral range based on capillary discharge plasmas
Alexander P. Shevelko, Larry V. Knight, R. Steven Turley, Oleg F. Yakushev
Author Affiliations +
Abstract
A compact device, based on fast capillary discharge plasmas, is an intense EUV and soft x-ray source of radiation. Th plasma is created by a discharge of low-inductance capacitors through a gas-filled ceramic capillary. Parameters of the discharge are: maximum current of 25 kA at applied voltage 40 kV, a pulse duration of 20-30 ns at FWHM, and a rise time of 1.5 ns. The soft x-ray and EUV emission of multiply charged ions is investigated using a compact 1 meter grazing incidence spectrometer-monochromator with a constant angle of deviation. The use of various gases allows the observation of XUV spectra in a wide spectral range (4- 45 nm). A Xe-filled capillary discharge shows intense radiation near 13.5 nm - the region of interest for EUV lithography applications. A reflectometer is used for testing grazing incidence gratings.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander P. Shevelko, Larry V. Knight, R. Steven Turley, and Oleg F. Yakushev "Intense XUV source of radiation within the 4- to 45-nm spectral range based on capillary discharge plasmas", Proc. SPIE 4504, Applications of X Rays Generated from Lasers and Other Bright Sources II, (14 November 2001); https://doi.org/10.1117/12.448459
Lens.org Logo
CITATIONS
Cited by 5 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Capillaries

Plasmas

Spectroscopy

Extreme ultraviolet

Xenon

Grazing incidence

Ions

RELATED CONTENT

EUV optics in photoionization experiments
Proceedings of SPIE (May 03 2013)
Capillary discharge plasmas as a source of EUV and soft...
Proceedings of SPIE (November 02 2000)
The GSI 5M Grazing Incidence Spectrometer
Proceedings of SPIE (November 27 1989)
EUV spectroscopy of ultrafast capillary discharges
Proceedings of SPIE (November 23 1999)
Comparison of different source concepts for EUVL
Proceedings of SPIE (August 20 2001)

Back to Top