20 December 2001 X-ray interferometry: ultra-high-resolution astronomy
Author Affiliations +
X-rays have tremendous potential for imaging at the highest angular resolution. The high surface brightness of many x-ray sources will reveal angular scales heretofore thought unreachable. The short wavelengths make instrumentation compact and baselines short. We discuss how practical x-ray interferometers can be built for astronomy using existing technology. We describe the Maxim Pathfinder and Maxim missions which will achieve 100 and 0.1 micro-arcsecond imaging respectively. The science to be tackled with resolution of up to one million times that of HST will be outlined, with emphasis on eventually imaging the event horizon of a black hole.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Webster C. Cash, Webster C. Cash, Ann F. Shipley, Ann F. Shipley, Randall Lee McEntaffer, Randall Lee McEntaffer, } "X-ray interferometry: ultra-high-resolution astronomy", Proc. SPIE 4506, Soft X-Ray and EUV Imaging Systems II, (20 December 2001); doi: 10.1117/12.450952; https://doi.org/10.1117/12.450952


MAXIM: the black hole imager
Proceedings of SPIE (October 10 2004)
Maxim: micro-arcsecond x-ray imaging mission
Proceedings of SPIE (February 25 2003)
MAXIM Pathfinder: a practical configuration
Proceedings of SPIE (January 28 2004)
X-ray interferometric observatory
Proceedings of SPIE (September 30 1991)
MAXIM science and technology
Proceedings of SPIE (October 19 2004)
The optical demonstration of an x-ray interferometer
Proceedings of SPIE (October 07 2005)
Active x ray optics for Generation X the next...
Proceedings of SPIE (June 14 2006)

Back to Top